Electron Optics and Nanoanalysis Lab: Publications (By Year)

NOTE : This list is frozen at early 2011 due to the migration to a new publications database system, and will be updated in due course. For more information about current publications, please consult the relevant group members directly.

Publications sorted by year for the Electron Optics and Nanoanalysis Lab. A list sorted by publication type and an index for all research groups are also available.

2009

| 2009 | 2008 | 2007 | 2006 | 2005 | 2004 | 2003 | 2002 | 2001 | 2000 | 1999 | 1997 | 1996 | -10276 |

  • M. M. El Gomati, F. N. Zaggout, C. G. H. Walker, X. Zha, The role of oxygen in secondary electron contrast of doped semiconductors in LVSEM, Proceedings SPIE - Scanning Electron Microscopes, Monterey, 978-0-8194-7654-8 ;, May, 2009
  • Christopher G. Walker, Mohamed M. El Gomati, James A. Matthew, Recent developments in the understanding and application of backscattered and secondary electrons in the SEM, SPIE Proceedings - Scanning Electron Microscopies, Monterey, 978-0-8194-7654-8, May, 2009

2008

| 2009 | 2008 | 2007 | 2006 | 2005 | 2004 | 2003 | 2002 | 2001 | 2000 | 1999 | 1997 | 1996 | -10276 |

  • M M EL Gomati, C G H Walker, A M D Assa'd, M Zadrazil, Theory Experiment Comparison of the Electron Backscattering Factor from Solids at Low Electron Energy (250-5,000 eV), Scanning, 30(1):2-15, February, 2008
  • C.G.H. Walker, F. Zaggout, M.M. El-Gomati, The role of oxygen in secondary electron contrast in doped semiconductors using low voltage scanning electron microscopy, Journal Applied Physics, 104:123713-12371, 2008
  • CGH Walker, M M El-Gomati, A M D Assa'd, and M Zadrazil, The secondary electron emission yield for 24 solid elements excited by primary electrons in the range 250-5000eV: A theory / experiment comparison, Scanning, 30:365-380, 0161-0457, 2008

2007

| 2009 | 2008 | 2007 | 2006 | 2005 | 2004 | 2003 | 2002 | 2001 | 2000 | 1999 | 1997 | 1996 | -10276 |

  • A Pratt, J A D. Matthew, M El-Gomati and S P Tear, Quantitative interpretation of the low-loss electron signal, Surface Science, 601(8):1804-1812, April, 2007
  • L Chen and M M El-Gomati, Fabrication of micro-field emitters on ceramic substrates, Microelectronic Engineering, 84(1):95-100, January, 2007
  • C.G.H. Walker, J. Foadi, J. Wilson, Classification of protein crystallisation images using Fourier descriptors, Journal Applied Crystallography, 40:418-426, 2007

2006

| 2009 | 2008 | 2007 | 2006 | 2005 | 2004 | 2003 | 2002 | 2001 | 2000 | 1999 | 1997 | 1996 | -10276 |

  • L Chen and M M El-Gomati, Stabilized emission from micro-field emitter for electron microscopy, Microelectronics and Reliability, 46(7):1209-1213, July, 2006
  • James P. Spallas, Charles S. Silver, Lawrence P. Muray, Torquil Wells and Mohamed El-Gomati, A manufacturable miniature electron beam column, Microelectronic Engineering, 83(-5):984-989, April-Septem, 2006
  • M Prutton, M M El Gomati, Scanning Auger Electron microscopy, Chichester, John Wiley, 978-0-470-86677-1, 2006

2005

| 2009 | 2008 | 2007 | 2006 | 2005 | 2004 | 2003 | 2002 | 2001 | 2000 | 1999 | 1997 | 1996 | -10276 |

  • M El-Gomati, F Zaggout, H Jayacody, S Tear, K Wilson, Why is it possible to detect doped regions of semiconductors in low voltage SEM: a review and update, Surface and Interface Analysis, 37(11):901 - 911, October, 2005
  • G H Jayakody, T R C Wells and M M El-Gomati, Imaging of doped Si in low and very low voltage SEM: the contrast interpretation, Journal of Electron Spectroscopy and Related Phenomena, 143(-1):235-241, May, 2005

2004

| 2009 | 2008 | 2007 | 2006 | 2005 | 2004 | 2003 | 2002 | 2001 | 2000 | 1999 | 1997 | 1996 | -10276 |

  • M El-Gomati, T Wells, I Mullerova, L Frank, H Jayakody, Why is it that differently doped regions in semiconductors are visible in low voltage SEM?, IEEE Transactions on Electron Devices, 51(2):288-292, 2004

2003

| 2009 | 2008 | 2007 | 2006 | 2005 | 2004 | 2003 | 2002 | 2001 | 2000 | 1999 | 1997 | 1996 | -10276 |

  • S Johnson, M El-Gomati, High resolution retarding field analyser, J Vac. Sci & Tech. B, 21:350-353, 2003
  • A Gelsthorpe and M El-Gomati, Identification of artifacts in auger electron spectroscopY due to surface topography, J Vac. Sci Tech. B, 21:744-747, 2003

2002

| 2009 | 2008 | 2007 | 2006 | 2005 | 2004 | 2003 | 2002 | 2001 | 2000 | 1999 | 1997 | 1996 | -10276 |

  • L Frank, I Mullerova, and M El-Gomati, SEM visualisation of doping in semiconductors, ICEM 15, Durban, South Africa, September, 2002
  • M El-Gomati, V Romanovsky, I Mullerova, and L Frank, A small size field emission column for surface studies, ICEM 15, 323-333, Durban, South Africa, September, 2002
  • M M El-Gomati, Low and very low voltage electron microscopy in semiconductor analysis, MicroScience 2002, Organised by The Royal Microscopical Society, London, July, 2002
  • L. Frank, I. Müllerová, M.M. El Gomati, H. Jayakody, SEM acquired electronic contrast of doped areas in semiconductors and its interpretation, Proceeedings of Japan Czech Conference on Nanotechnology, 144-147, Nara, Japan, 2002
  • M El-Gomati and T Wells, Very low energy electron microscopy of doped semiconductors, Applied Physics Letters, 79(18):2931-2933, 2002
  • I Mullerova, L Frank and M El-Gomati, Imaging of the boron doping in silicon using low energy SEM, Ultramicroscopy, 93:223-243, 2002

2001

| 2009 | 2008 | 2007 | 2006 | 2005 | 2004 | 2003 | 2002 | 2001 | 2000 | 1999 | 1997 | 1996 | -10276 |

  • M El-Gomati, Low energy scanning analytical microscope (LeSAM), Practical surface analysis, Nara, Japan, November, 2001
  • M El-Gomati, V Romanovsky, L Frank, and I Mullerova, A very low energy electron column fr surface studies, Proceeding of EMAG, Institute of Physics Conf ser, 111-114, Dundee, September, 2001
  • M El-Gomati and T Wells, Contrast reversal of doped semiconductor imaged in LVSEM, Proceeding of EMAG 2001, IoP Conf ser, 489-492, Dundee, UK, September, 2001
  • A Gelsthorpe and M El-Gomati, A multi-channel detector for Auger spectroscopic analysis, Proceeding of EMAG, Institute of Physics Conf ser, 69-72, Dundee UK, September, 2001
  • M El-Gomati, T Wells and H Jayakody, Imaging doped regions in a semiconductor with very low energy SEM and Auger electrons, Proceeding of EMAG 2001, Institute of Physics Conf. Ser, 489-492, Dundee, UK, September, 2001
  • S Johnson, J Mehadevan, L Enloe and M El-Gomati, A small size retarding field analyzer, Proceedings of IVMC, 11-12, Davis Calif, 0-7803-7197-6, August, 2001
  • A Gelsthorpe and M El-Gomati, Identification of artefacts due to surface topography in Auger analysis, Proceedings of IVMC, 241-242, Davis Calif, 0-7803-7197-6, August, 2001
  • M M El-Gomati, T Wells and H Jayakody, Very low energy electron microscopy of doped semiconductors, Proceedings of 13th international Conference on Microscopy of semiconductor materials, 435-438, Oxford, March, 2001

2000

| 2009 | 2008 | 2007 | 2006 | 2005 | 2004 | 2003 | 2002 | 2001 | 2000 | 1999 | 1997 | 1996 | -10276 |

  • M M El-Gomati, T Wells, H Jayakodi, Low energy SEM of doped semiconductor, Device Microscopy, Institute of Physics, London, September, 2000
  • El-Gomati, Auger analysis of microfabricated field emission structures, Institute of Physics Conf. Ser., Rutherford Appleton Laborator, September, 2000
  • M El-Gomati, A low energy electron column for surface analysis, 7th Conference on charged particle optics, Skalsky Dvur, Czech Rep, July, 2000
  • M M El-Gomati, T Wells, L Frank and I Mullerova, On the imaging of semiconductor doping using low energy electron microscopy, 12th European congress on electron microscopy, 635-636, Brno, Czech Republic, July, 2000
  • M El-Gomati, On the image contrast of doped semiconductors, 7th Conference on charged particle optics, Skalsky Dvur, Czech Rep, July, 2000
  • M M El-Gomati, A Gelsthorpe, J A Dell, Auger analysis of sharp topographies: Quantification at high spatial resolution, 12th European congress on electron microscopy, 355-358, Brno, Czech Republic, July, 2000
  • M M El-Gomati, T Wells, Imaging doped semiconductor using SLEEM, 12th International Quantitative Surface Analysis, Surrey, UK, July, 2000
  • A Gelsthorpe, A Jackson, M M El-Gomati, Rapid identification of edge artefacts in Scanning Auger Microscopy, 12th International Quantitative Surface Analysis, Surrey, UK, July, 2000
  • L. Frank, I. Mullerova and M M El Gomati, A novel In-lens detector for electrostatic scanning LEEM mini-column, Ultramicroscopy, 81:99-110, 2000

1999

| 2009 | 2008 | 2007 | 2006 | 2005 | 2004 | 2003 | 2002 | 2001 | 2000 | 1999 | 1997 | 1996 | -10276 |

  • L Frank, R Stekly, M Zadrazil, M M El-Gomati, I Mullerova, To the information depth of the backscattered electron signal, Proceedings IV multinational congress on electron microscopy, 315-316, Hungary, September, 1999
  • R Stekley, M Zadrazil, M M El-Gomati, L Frank, I Mullerova, Surface cleanliness and electron backscattering, Proceeding of EMAS 99, 344, Constanz, Germany, April, 1999
  • M M El-Gomati, Li Chen, Stabilised emission from micro field emitter for electron microscopy, IVMC 99, 412-413, Darmstadt, Germany, 1999
  • C Walker, A Walker, R Badheka, S Kumashiro, M Jacka, M M El-Gomati, M Prutton, F Read, A fast parallel acquisition electron energy analyser, Proceeding SPIE, 344-360, 1999
  • M Jacka, M Kirk, M El-Gomati and M Prutton, A fast, parallel acquisition, electron energy analyser: The hyperbolic field analyser, J Scientific Instruments, 70(5):2282-2287, 1999
  • M M El-Gomati, J A Dell, H Yan H, A Asa'ad, Auger analysis of microfabricated emitters: A Monte Carlo simulation study, IVMC 99, 130-131, Darmstadt, Germany, 1999
  • Li Chen and M El Gomati, Field emission studies of tungsten coated silicon based field emitters, Ultramicroscopy, 79:135-140, 1999
  • A.M.D. Assa'd, M. El Gomati and J.A. Dell, Monte Carlo simulations of nanometric structures analysis of micromachined field emitters, Ultramicroscopy, 79:141-147, 1999

1997

| 2009 | 2008 | 2007 | 2006 | 2005 | 2004 | 2003 | 2002 | 2001 | 2000 | 1999 | 1997 | 1996 | -10276 |

  • Srnanek R, El-Gomati M M, Novotny I, and Pudis D, Chemical beveling of InP-based structures by HBr-H3PO4 - K2Cr2O7, Journal of Crystal Growth, 179:320-323, 1997
  • Srnanek R, Novotny I, Hotovy I, and El-Gomati M M, Chemical Beveling of GaAs based structures, Material Science and Engineering, B47:127-130, 1997
  • Wells T, El-Gomati M M and Wood J, Low temperature reactive ion etching of silicon with SF6/O2 plasmas, Journal of Vacuum Science Technology, B15(2):434-448, 1997
  • Matthew J A D, Jackson A R and El-Gomati M M, Systematic trends in the transport mean free path with electron energy and atomic number, Journal of Electron Spectroscopy and related Phenomena, 85:205-219, 1997
  • Jackson A R, El-Gomati M M and Matthew J A D, Monte Carlo Calculations of the Depth Distribution Function in Multilayered Structures, Surface and Interface Analysis, 25:341-351, 1997
  • R Roberts, M M El-Gomati, J Kudjoe, M Prutton, S Bean, An all-electrostatic field emission electron column for surface analytical microscopy, Measurements in Scientific Technology, 8:536-545, 1997

1996

| 2009 | 2008 | 2007 | 2006 | 2005 | 2004 | 2003 | 2002 | 2001 | 2000 | 1999 | 1997 | 1996 | -10276 |

  • El Bakush T A and El-Gomati M M, Spectrum Synthesis Based on Non-linear Addition, Surface and Interface Analysis, 24:163-172, 1996
  • El-Gomati M M and El Bakush T A, Sources of Internal Scattering of Electrons in a Cylindrical Mirror Analyser (CMA), Surface and Interface Analysis, 24:152-162, 1996

-10276

| 2009 | 2008 | 2007 | 2006 | 2005 | 2004 | 2003 | 2002 | 2001 | 2000 | 1999 | 1997 | 1996 | -10276 |

  • A. Mackova, S.A. Morton, C.G.H. Walker, K. Volka, Surface Analysis Techniques -Handbook of Spectroscopy, Wiley-VCH Verlag GmbH, 3-527-29782-0, -10276

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